51 CT, OP, FL 33334

Parcel: 494215060730 · 01 · Zoning:

Assessed Value (2026)
$102,660

Property Details

Year Built
1959
Lot Sqft
5,504

Sales History

1
$275,000
2005-07-27
2
$90,000-67%
2012-01-11
3
$100non-market transfer
2020-10-15

Tax Assessment History

$102,660
Assessed (2026)
$408,730
Market Value
$52,660
Taxable Value
$1,072
Annual Tax
2025
$190,320
$0
2026
$102,660
$408,730
Assessed Market
View detailed table
YearAssessedMarketTaxableTax
2026 $102,660 $408,730 $52,660 $1,072
2025 $190,320 $ $49,670 $1,011

About 51 CT, OP, FL 33334

51 CT, OP, FL 33334 is a property built in 1959 on a 5,504 square foot lot. The property is currently owned by STROBLE,KEITH A & NANCY E EVANS,TRISTA MARIE, recorded as of 2026-04-26. The owner appears to be owner-occupied based on the mailing address matching the property address.

The most recent sale was on 2020-10-15 for $100. The property sold for $89,900 less than the prior sale of $90,000 on 2012-01-11. There are 3 recorded sales for this property.

The 2026 assessed value is $102,660 with a market value of $408,730. This breaks down to $38,530 for the land and $370,200 for the building. The assessed value decreased 46% from $190,320 in 2025.

51 CT, OP, FL 33334 is located in OP, Florida. Property records, tax assessments, sales history, and ownership information for this OP property are sourced from broward County public records. The complete ownership history of this property spans from 2005 to 2020, with 3 recorded transactions in the public record..

Current Owner

STROBLE,KEITH A & NANCY E EVANS,TRISTA MARIE
470 NE 51 CT, OAKLAND PARK, FL, 33334
Since: 2026-04-26
View owner profile →

Est. Annual Insurance

$1,900 — $3,800
Flood $400 — $800
Property/Wind $1,500 — $3,000

Estimate based on FEMA flood zone, property value, and year built. Actual premiums vary based on elevation, mitigation features, roof condition, and insurer. Not a quote.

Neighborhood 33334

56.6%
Owner-Occ
43.4%
Investor
288
Flips (4yr)
4,789
New Biz (3yr)
Distress Risk
ELEVATED
56
View full risk analysis →